Self-Calibrating Noniterative Complex Permittivity Extraction of Thin Dielectric Samples
Özet
A microwave method relying on uncalibrated scattering (S-) parameters is proposed to measure the complex permittivity (?r) of thin dielectric samples. It has the following two main advantages. First, it takes into account effect of the sample holder, used for holding the sample, especially important for thin sample electromagnetic property characterization. Second, it does not require any specific information about the location of the sample (and its holder) inside its measurement cell for ?r extraction. For validation of our method, we applied a commercial three-dimensional electromagnetic simulation program-CST Microwave Studio-and the Lorentz dispersion model. Uncalibrated (as well as calibrated) S-parameter measurements were conducted to measure ?r of a 0.7 mm thick polyethylene sample (the sample holder was a 5.18 mm thick PVC sample) by our method and other similar methods in the literature. From the comparison, we observed that while the accuracy of tested methods significantly changed with inaccurate knowledge of the sample position inside its cell, the accuracy of our method did not much alter. © 1964-2012 IEEE.
Kaynak
IEEE Transactions on Electromagnetic CompatibilityCilt
60Sayı
2Koleksiyonlar
İlgili Öğeler
Başlık, yazar, küratör ve konuya göre gösterilen ilgili öğeler.
-
Noniterative complex permittivity retrieval using calibration-independent waveguide measurements
Hasar U.C.; Kaya Y. (Elsevier B.V., 2017)Calibration-independent nonresonant measurements can be employed to eliminate the need for calibration before microwave measurements. These methods generally assume that the location of the sample in its measurement cell ... -
Reference-plane invariant transmission-reflection method for measurement of constitutive parameters of liquid materials
Hasar U.C.; Barroso J.J.; Kaya Y.; Ertugrul M.; Bute M. (2013)We propose a new transmission-reflection method for measuring constitutive parameters of liquid samples inside an asymmetric measurement cell (a sample over a low-loss holder in vertical position inside an empty waveguide ... -
Two-step numerical procedure for complex permittivity retrieval of dielectric materials from reflection measurements
Hasar U.C.; Barroso J.J.; Kaya Y.; Ertugrul M.; Bute M.; Catalá-Civera J.M. (Springer Verlag, 2014)A two-step measurement procedure has been proposed for measurement of complex permittivity of dielectric materials using one-port reflection measurements. In the procedure, as a first step, a graphical method is applied ...