Hasar, Ugur C.Ozturk, GokhanKaya, YunusErtugrul, Mehmet2024-10-042024-10-0420220018-926X1558-2221https://doi.org/10.1109/TAP.2021.3121133http://hdl.handle.net/20.500.12403/3064A time-domain free-space technique has been proposed to extract relative permittivity (epsilon(r)) and effective conductivity (sigma(e)) of low-loss dielectric samples using their metal- and air-backed calibration-free reflected powers. Numerical computations and 3-D electromagnetic simulations were performed to validate the method. A sensitivity analysis was carried out to examine its accuracy. Calibration-free time-domain free-space measurements over 1-12 GHz were conducted by VNA to extract epsilon(r) and sigma(e) of polyethylene and polypropylene low-loss samples.eninfo:eu-repo/semantics/closedAccessFree-spacepermittivityreflectionlime-domainArticle7021565156810.1109/TAP.2021.31211332-s2.0-85118620563Q1WOS:000751857700081Q1