Hasar, Ugur CemKaya, YunusOzturk, HamdullahIzginli, MucahitErtugrul, MehmetBarroso, Joaquim JoseRamahi, Omar M.2024-10-042024-10-0420220018-94561557-9662https://doi.org/10.1109/TIM.2022.3153991http://hdl.handle.net/20.500.12403/3388A new deembedding technique is proposed for relative complex permittivity epsilon(r) determination of dielectric materials using gated free-space measurements. Its three main features are 1) it does not require any formal calibration procedure (calibration-free); 2) it is position-insensitive; and 3) it extracts ripple-free epsilon(r) due to gating process. The objective function derived to determine epsilon(r) by the proposed method is validated by free-space measurements of three dielectric samples (polypropylene, polyethylene, and polyoxymethylene). Besides, the accuracy of our method is compared with the accuracy of other calibrationfree and calibration-dependent methods in the literature.eninfo:eu-repo/semantics/closedAccessComplex permittivitydeembedding techniquefree-spacegatinguncalibrated measurementsArticle7110.1109/TIM.2022.31539912-s2.0-85125330581Q1WOS:000770592900011Q1