Hasar, Ugur CemOzturk, HamdullahKaya, YunusIzginli, MucahitErtugrul, Mehmet2024-10-042024-10-0420211531-13091558-1764https://doi.org/10.1109/LMWC.2020.3046697http://hdl.handle.net/20.500.12403/3578A microwave method has been proposed for constitutive parameters' extraction of samples on a known substrate. The advantage of this method is that it relies on noniterative reflection-only (air- and metal-backed) scattering (S-) parameters so that it is a good candidate for the characterization of samples when only one-port measurements are available. It is validated by the X-band (8.2-12.4 GHz) waveguide S-parameter measurements. A sensitivity analysis is followed to evaluate and improve the performance of our method.eninfo:eu-repo/semantics/closedAccessComplex permeabilitycomplex permittivityknown substratenoniterativereflection-onlyArticle31332032310.1109/LMWC.2020.30466972-s2.0-85099534466Q1WOS:000629021700024Q2