Geçici B.Korkmaz S.Özen S.Šenay V.Pat S.20.04.20192019-04-2020.04.20192019-04-2020160217-9849https://dx.doi.org/10.1142/S0217984915300124https://hdl.handle.net/20.500.12403/569Paramelaconite (Cu4O3) is a metastable copper oxide. Metastable copper oxide thin films were deposited on glass substrates by reactive RF magnetron sputtering in argon (Ar) and oxygen (O2) gas mixture atmospheres. Ar/O2 gas ratios in the sputtering ambient were chosen as 1/1 and 1/9. The surface and optical properties were determined by X-ray diffractometer (XRD), atomic force microscope (AFM) and UV-Vis spectrophotometer. The XRD patterns of the samples exhibited single strong diffraction peaks at 35.39° and 35.49° , corresponding to the (202) peak of Cu4O3. The mean thickness values were measured as 100 nm and 80 nm for the films deposited at 1/1 and 1/9 Ar/O2 gas ratios, respectively. The samples showed low transmittance and high absorbance in the high frequency region. © 2016 World Scientific Publishing Company.eninfo:eu-repo/semantics/closedAccessAFMMetastable copper oxide thin filmreactive RF sputterXRDAFMMetastable copper oxide thin filmreactive RF sputterXRDReview Article303510.1142/S02179849153001242-s2.0-85019403154Q3WOS:000391560000001Q4