Alim, BunyaminHan, IbrahimDemir, Lutfu2024-10-042024-10-0420181687-8507https://doi.org/10.1016/j.jrras.2017.12.002http://hdl.handle.net/20.500.12403/2951K shell X-ray fluorescence cross-sections (sigma(K alpha), sigma(K beta) and sigma(K)), and K shell fluorescence yields (omega(K)) of Ti, Ni both in pure metals and in different alloy compositions (TixNi1-x; x = 0.3, 0.4, 0.5, 0.6, 0.7) were measured by using energy dispersive X-ray fluorescence (EDXRF) technique. The samples were excited by 22.69 keV X-rays from a 10 mCi Cd-109 radioactive point source and K X rays emitted by samples were counted by a high resolution Si(Li) solid-state detector coupled to a 4 K multichannel analyzer (MCA). The alloying effects on the X-ray fluorescence (XRF) parameters of Ti-Ni shape memory alloys (SMAs) were investigated. It is clearly observed that alloying effect causes to change in K shell XRF parameter values in Ti-Ni based SMAs for different compositions of x. Also, the present investigation makes it possible to perform reliable interpretation of experimental sigma(K alpha), sigma(K beta) and omega(K) values for Ti and Ni in SMAs and can also provide quantitative information about the changes of K shell X-ray fluorescence cross sections and fluorescence yields of these metals with alloy composition. (c) 2017 The Egyptian Society of Radiation Sciences and Applications. Production and hosting by Elsevier B.V.eninfo:eu-repo/semantics/openAccessAlloying effectXRFK X-ray fluorescence cross-sectionK shell fluorescence yieldShape memory alloyArticle11215015610.1016/j.jrras.2017.12.002WOS:000432446700007Q2