Hasar, Ugur CemOzturk, GokhanKaya, YunusBute, MusaKaraaslan, MuharremBarroso, Joaquim J.Ramahi, Omar M.2024-10-042024-10-0420220018-926X1558-2221https://doi.org/10.1109/TAP.2022.3195500http://hdl.handle.net/20.500.12403/3329An extraction technique is proposed for electromagnetic characterization of metal-backed multilayer metamaterial (MM) structures demonstrating reflection-asymmetric property. It uses recursive scattering parameters for direct and reversed configurations of a multilayer structure. The algorithm was validated by comparing the extracted electromagnetic properties of multilayer structures composed of different MM unit cells with those determined by one-layer-only S-parameter methods. Two-layer and three-layer multilayer structures composed of MM slabs with C-shaped and Omega-shaped rings and an FR4 material were fabricated and measured for experimental validation. A sensitivity analysis was also conducted to quantitatively evaluate the performance of our method against a small air gap between the multilayer structures and the short-circuit termination and between adjacent MM slabs within these structures. Strong agreement was observed between the resulted obtained using our method and measurements.eninfo:eu-repo/semantics/closedAccessConstitutive parametersmetal-backingmetamaterialsmultilayerretrievalArticle7011106501065910.1109/TAP.2022.31955002-s2.0-85136130708Q1WOS:000898716700064Q1