Hasar U.C.Barroso J.J.Kaya Y.Bute M.Ertugrul M.20.04.20192019-04-2020.04.20192019-04-2020140920-5071https://dx.doi.org/10.1080/09205071.2014.896227https://hdl.handle.net/20.500.12403/783In this research paper, we propose a simple procedure for accurate, stable and broadband measurements of complex permittivity of low-loss dielectric samples with considerable lengths. We identify and demonstrate by numerical and analytical analyses the main ill-behaved factor that gives rise to inaccurate peaks for measurements of electrical properties of low-loss samples in the well-known Nicolson-Ross-Weir method. Without using this factor in the expressions and combining better features of the methods available in the literature, the proposed procedure allows highly accurate permittivity measurements over a broad band. We have validated the proposed method by permittivity measurements of a low-loss sample by different methods. © 2014 Taylor & Francis.eninfo:eu-repo/semantics/closedAccesslow-loss samplesmaterials testingmicrowave measurementspermittivityElectric propertiesFrequency bandsMaterials testingMicrowave measurementNumerical methodsPermittivityAnalytical analysisBroadband measurementsComplex permittivityComplex permittivity measurementLow loss materialLow-lossNicolson-Ross-Weir methodsResearch papersPermittivity measurementlow-loss samplesmaterials testingmicrowave measurementspermittivityElectric propertiesFrequency bandsMaterials testingMicrowave measurementNumerical methodsPermittivityAnalytical analysisBroadband measurementsComplex permittivityComplex permittivity measurementLow loss materialLow-lossNicolson-Ross-Weir methodsResearch papersPermittivity measurementSimple procedure for robust and accurate complex permittivity measurements of low-loss materials over a broad frequency bandArticle28890391510.1080/09205071.2014.8962272-s2.0-84898013956Q3WOS:000333883600001Q3