Hasar, Ugur CemKaya, YunusOzturk, HamdullahIzginli, MucahitBarroso, Joaquim JoseRamahi, Omar M.Ertugrul, Mehmet2024-10-042024-10-0420220196-28921558-0644https://doi.org/10.1109/TGRS.2021.3090712http://hdl.handle.net/20.500.12403/3114A free-space time-domain method is proposed to retrieve dielectric constant (epsilon r), conductivity (sigma e), and thickness (d) of metal-backed low-loss dielectric samples using calibration-independent reflected power peak measurements. Its algorithm is validated by numerical calculations and simulations (CST Microwave Studio) using a sine-modulated Gaussian window. A sensitivity analysis is followed to examine its performance considering the dependencies of reflected power peaks with respect to epsilon r and sigma e. Free-space time-domain measurements have been implemented after transforming frequency-domain measurements into time-domain ones to extract epsilon r, sigma e, and d of polypropylene, polyethylene, and polyoxymethylene samples.eninfo:eu-repo/semantics/closedAccessTime-domain analysisAntenna measurementsTransmission line measurementsPermittivity measurementThickness measurementTemperature measurementBroadband antennasComplex permittivityfree-spacemetal-backedreflection-onlythicknesstime-domainArticle6010.1109/TGRS.2021.30907122-s2.0-85107805351Q1WOS:000732803800001Q1