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Effect of XRD relative intensities of the Li (002) on surface, optical and electrochemical impedance spectroscopy analyses of the deposited LiCoO2 thin film

Yudar H.H.; Pat S.; Özen S.; Şenay V.; Korkmaz Ş.; Pat Z. (Springer New York LLC, 2017)

In this paper, the effect of RF power on LiCoO2 thin films was investigated using X-ray diffractometer (XRD), atomic force microscopy, UV–Vis spectrophotometer, and potentiostat. The microstructural, surface, optical and ...