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Effect of XRD relative intensities of the Li (002) on surface, optical and electrochemical impedance spectroscopy analyses of the deposited LiCoO2 thin film
(Springer New York LLC, 2017)
In this paper, the effect of RF power on LiCoO2 thin films was investigated using X-ray diffractometer (XRD), atomic force microscopy, UV–Vis spectrophotometer, and potentiostat. The microstructural, surface, optical and ...