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Effect of XRD relative intensities of the Li (002) on surface, optical and electrochemical impedance spectroscopy analyses of the deposited LiCoO2 thin film

Yudar H.H.; Pat S.; Özen S.; Şenay V.; Korkmaz Ş.; Pat Z. (Springer New York LLC, 2017)

In this paper, the effect of RF power on LiCoO2 thin films was investigated using X-ray diffractometer (XRD), atomic force microscopy, UV–Vis spectrophotometer, and potentiostat. The microstructural, surface, optical and ...

Zn/ZnSe thin films deposition by RF magnetron sputtering

Yudar H.H.; Pat S.; Korkmaz Ş.; Özen S.; Şenay V. (Springer New York LLC, 2017)

In this paper, Zn/ZnSe thin films were deposited on glass substrates by RF magnetron sputtering system. XRD analyses were done. Zn and ZnSe phases were obtained. Miller indices of obtained Zn phases were detected in (320), ...