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Effect of XRD relative intensities of the Li (002) on surface, optical and electrochemical impedance spectroscopy analyses of the deposited LiCoO2 thin film

Yudar H.H.; Pat S.; Özen S.; Şenay V.; Korkmaz Ş.; Pat Z. (Springer New York LLC, 2017)

In this paper, the effect of RF power on LiCoO2 thin films was investigated using X-ray diffractometer (XRD), atomic force microscopy, UV–Vis spectrophotometer, and potentiostat. The microstructural, surface, optical and ...

The Al doping effect on the surface, optical, electrical and nanomechanical properties of the ZnO and AZO thin films prepared by RF sputtering technique

Pat S.; Mohammadigharehbagh R.; Özen S.; Şenay V.; Yudar H.H.; Korkmaz Ş. (Elsevier Ltd, 2017)

In this study, ZnO and aluminum doped ZnO (AZO) thin films were deposited at constant RF power of 100 W for the determine of the structural, surface, optical, electrical and nanomechanical properties. X–Ray diffraction ...