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Effect of XRD relative intensities of the Li (002) on surface, optical and electrochemical impedance spectroscopy analyses of the deposited LiCoO2 thin film

Yudar H.H.; Pat S.; Özen S.; Şenay V.; Korkmaz Ş.; Pat Z. (Springer New York LLC, 2017)

In this paper, the effect of RF power on LiCoO2 thin films was investigated using X-ray diffractometer (XRD), atomic force microscopy, UV–Vis spectrophotometer, and potentiostat. The microstructural, surface, optical and ...

Zn/ZnSe thin films deposition by RF magnetron sputtering

Yudar H.H.; Pat S.; Korkmaz Ş.; Özen S.; Şenay V. (Springer New York LLC, 2017)

In this paper, Zn/ZnSe thin films were deposited on glass substrates by RF magnetron sputtering system. XRD analyses were done. Zn and ZnSe phases were obtained. Miller indices of obtained Zn phases were detected in (320), ...

Morphology, composition, structure and optical properties of CuO/Cu2O thin films prepared by RF sputtering method

Korkmaz Ş.; Geçici B.; Korkmaz S.D.; Mohammadigharehbagh R.; Pat S.; Özen S.; Şenay V.; Yudar H.H. (Elsevier Ltd, 2016)

In this paper, copper oxide (CuO/Cu2O) nanocrystalline thin films were deposited by radio frequency (RF) magnetron sputtering system at 75 W and 100 W. The surface, optical, composition and structural properties of obtaining ...

Surface and optical properties of indium tin oxide layer deposition by RF magnetron sputtering in argon atmosphere

Yudar H.H.; Korkmaz Ş.; Özen S.; Şenay V.; Pat S. (Springer Verlag, 2016)

This study focused on the characterization and properties of transparent and conductive indium tin oxide (ITO) thin films deposited in argon atmosphere. ITO thin films were coated onto glass substrates by radio frequency ...