Yazar "Bute M." için Scopus İndeksli Yayınlar Koleksiyonu listeleme
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Attractive method for thickness-independent permittivity measurements of solid dielectric materials
Hasar U.C.; Barroso J.J.; Bute M.; Kaya Y.; Kocadagistan M.E.; Ertugrul M. (2014)We propose a non-resonant-type method for reference-plane invariant and thickness-independent permittivity measurement of solid dielectric materials when there is no information from permittivity. To achieve this, we derive ... -
Microwave method for reference-plane-invariant and thickness-independent permittivity determination of liquid materials
Hasar U.C.; Kaya Y.; Bute M.; Barroso J.J.; Ertugrul M. (2014)An attractive transmission-reflection method based on reference-plane invariant and thickness-independent expressions has been proposed for accurate and unique retrieval of complex permittivity of dielectric liquid samples. ... -
Power analysis of multilayer structures composed of conventional materials and bi-anisotropic metamaterial slabs
Hasar U.C.; Bute M.; Barroso J.J.; Sabah C.; Kaya Y.; Ertugrul M. (Optical Society of America, 2014)In this paper, we analyze wave propagation properties (transmitted, reflected, and absorbed powers) of composite multilayer structures consisting of bi-anisotropic metamaterial (MM) slabs and conventional isotropic materials. ... -
Reference-plane invariant transmission-reflection method for measurement of constitutive parameters of liquid materials
Hasar U.C.; Barroso J.J.; Kaya Y.; Ertugrul M.; Bute M. (2013)We propose a new transmission-reflection method for measuring constitutive parameters of liquid samples inside an asymmetric measurement cell (a sample over a low-loss holder in vertical position inside an empty waveguide ... -
Reference-Plane-Invariant Effective Thickness and Electromagnetic Property Determination of Isotropic Metamaterials Involving Boundary Effects
Hasar U.C.; Barroso J.J.; Buldu G.; Bute M.; Kaya Y.; Karacali T.; Ertugrul M. (Institute of Electrical and Electronics Engineers Inc., 2015)It is well recognized that near-field effects become dominant when the metamaterial (MM) is in resonance. In addition, any inaccurate information of the location of reference planes, and the effective length can seriously ... -
Simple procedure for robust and accurate complex permittivity measurements of low-loss materials over a broad frequency band
Hasar U.C.; Barroso J.J.; Kaya Y.; Bute M.; Ertugrul M. (VSP BV, 2014)In this research paper, we propose a simple procedure for accurate, stable and broadband measurements of complex permittivity of low-loss dielectric samples with considerable lengths. We identify and demonstrate by numerical ... -
Two-step numerical procedure for complex permittivity retrieval of dielectric materials from reflection measurements
Hasar U.C.; Barroso J.J.; Kaya Y.; Ertugrul M.; Bute M.; Catalá-Civera J.M. (Springer Verlag, 2014)A two-step measurement procedure has been proposed for measurement of complex permittivity of dielectric materials using one-port reflection measurements. In the procedure, as a first step, a graphical method is applied ...