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dc.contributor.authorYudar H.H.
dc.contributor.authorPat S.
dc.contributor.authorÖzen S.
dc.contributor.authorŞenay V.
dc.contributor.authorKorkmaz Ş.
dc.contributor.authorPat Z.
dc.date.accessioned20.04.201910:49:12
dc.date.accessioned2019-04-20T21:43:17Z
dc.date.available20.04.201910:49:12
dc.date.available2019-04-20T21:43:17Z
dc.date.issued2017
dc.identifier.issn0957-4522
dc.identifier.urihttps://dx.doi.org/10.1007/s10854-017-6665-4
dc.identifier.urihttps://hdl.handle.net/20.500.12403/486
dc.description.abstractIn this paper, the effect of RF power on LiCoO2 thin films was investigated using X-ray diffractometer (XRD), atomic force microscopy, UV–Vis spectrophotometer, and potentiostat. The microstructural, surface, optical and electrochemical impedance measurements were performed to LiCoO2 thin films, are used to for the fully solid-state battery cathode material. According to obtained results, the relative intensities of the Li (002) crystal phase in XRD patterns of deposited LiCoO2 thin films were increased by increasing applied RF power, for the first time. The intensity of the LiCoO2 (104) plane is nearly invariant. The relative intensities of the LiCoO2 (113) plane were decreased by increasing RF power. The peak locations of the Li (002) and LiCoO2 (104) were not changed. It was found that Li (002) relative intensities affect the all investigated parameters for the LiCoO2 thin films. Especially, transmittance value increased about 20%. The band gap of the deposited film was changed 100–300 meV drastically. Deposited samples are shown high transparency in the visible region. Randles circuit was used for the equivalent circuit model. Nyquist plots, fitting parameters values and value of the circuit elements were estimated by ZSim software. © 2017, Springer Science+Business Media New York.en_US
dc.language.isoengen_US
dc.publisherSpringer New York LLC
dc.relation.isversionof10.1007/s10854-017-6665-4
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectAtomic force microscopy
dc.subjectCathodes
dc.subjectElectrochemical impedance spectroscopy
dc.subjectEnergy gap
dc.subjectEquivalent circuits
dc.subjectLithium
dc.subjectSolid state devices
dc.subjectVoltage regulators
dc.subjectCath-ode materials
dc.subjectElectrochemical impedance measurements
dc.subjectEquivalent circuit model
dc.subjectFitting parameters
dc.subjectHigh transparency
dc.subjectRelative intensity
dc.subjectSolid state batteries
dc.subjectX ray diffractometers
dc.subjectThin films
dc.subjectAtomic force microscopy
dc.subjectCathodes
dc.subjectElectrochemical impedance spectroscopy
dc.subjectEnergy gap
dc.subjectEquivalent circuits
dc.subjectLithium
dc.subjectSolid state devices
dc.subjectVoltage regulators
dc.subjectCath-ode materials
dc.subjectElectrochemical impedance measurements
dc.subjectEquivalent circuit model
dc.subjectFitting parameters
dc.subjectHigh transparency
dc.subjectRelative intensity
dc.subjectSolid state batteries
dc.subjectX ray diffractometers
dc.subjectThin films
dc.titleEffect of XRD relative intensities of the Li (002) on surface, optical and electrochemical impedance spectroscopy analyses of the deposited LiCoO2 thin filmen_US
dc.typearticleen_US
dc.relation.journalJournal of Materials Science: Materials in Electronicsen_US
dc.contributor.departmentBayburt Universityen_US
dc.contributor.authorID57189904041
dc.contributor.authorID9274843500
dc.contributor.authorID55897767500
dc.contributor.authorID55897416100
dc.contributor.authorID7003415405
dc.contributor.authorID54883956500
dc.identifier.volume28
dc.identifier.issue13
dc.identifier.startpage9289
dc.identifier.endpage9294
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US


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