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dc.contributor.authorHasar U.C.
dc.contributor.authorBarroso J.J.
dc.contributor.authorKaya Y.
dc.contributor.authorKaracali T.
dc.contributor.authorErtugrul M.
dc.date.accessioned20.04.201910:49:12
dc.date.accessioned2019-04-20T21:44:06Z
dc.date.available20.04.201910:49:12
dc.date.available2019-04-20T21:44:06Z
dc.date.issued2015
dc.identifier.issn1569-4410
dc.identifier.urihttps://dx.doi.org/10.1016/j.photonics.2014.12.003
dc.identifier.urihttps://hdl.handle.net/20.500.12403/770
dc.description.abstractIn this study, we investigate transmitted, reflected, and absorbed powers in forward and backward directions of periodic and aperiodic multilayered structures composed of bi-anisotropic metamaterial (MM) slab and conventional material. Aperiodic multilayered structure is realized by a change in thickness of any bi-anisotropic MM slab or of any conventional material. From this analysis, we note the following key results. First, identical (non-identical) forward and backward transmitted (reflected and absorbed) powers are observed for the analyzed periodic and aperiodic multilayered structures due to reciprocity (reflection-asymmetry) of bi-anisotropic MM slabs. Second, thickness-resonance phenomenon of conventional materials produces some peaks in the transmitted powers of periodic multilayered structures aside from the resonance frequency region of bi-anisotropic MM slabs. Third, each thickness-resonance frequency splits into many frequencies upon increasing the number of sections of periodic multilayered structures (no splitting when number of periods is one). Fourth, while the effect of changing the thickness of any bi-anisotropic MM slab within the aperiodic multilayered structure has no considerable effect around the resonance region of bi-anisotropic MM slabs (resonance of resonating structures such as MM slabs does not change with thickness), the same change in thickness of the conventional material drastically alters forward/backward reflected and absorbed powers aside from the resonance region of bi-anisotropic MM slabs (thickness-resonance totally depends on the value of thickness of conventional materials). The outcomes presented here can be particularly useful for propagation-related applications requiring cascade connection of various MM slabs. © 2014 Elsevier B.V. All rights reserved.en_US
dc.language.isoengen_US
dc.publisherElsevier
dc.relation.isversionof10.1016/j.photonics.2014.12.003
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectBi-anisotropic
dc.subjectConventional materials
dc.subjectMetamaterials
dc.subjectPower analysis
dc.subjectMetamaterials
dc.subjectNatural frequencies
dc.subjectOptical anisotropy
dc.subjectAnisotropic metamaterials
dc.subjectConventional materials
dc.subjectForward-and-backward
dc.subjectMulti-layered structure
dc.subjectPeriodic multilayered structures
dc.subjectPower analysis
dc.subjectResonance frequencies
dc.subjectResonating structures
dc.subjectPeriodic structures
dc.subjectBi-anisotropic
dc.subjectConventional materials
dc.subjectMetamaterials
dc.subjectPower analysis
dc.subjectMetamaterials
dc.subjectNatural frequencies
dc.subjectOptical anisotropy
dc.subjectAnisotropic metamaterials
dc.subjectConventional materials
dc.subjectForward-and-backward
dc.subjectMulti-layered structure
dc.subjectPeriodic multilayered structures
dc.subjectPower analysis
dc.subjectResonance frequencies
dc.subjectResonating structures
dc.subjectPeriodic structures
dc.titleInvestigation of transmitted, reflected, and absorbed powers of periodic and aperiodic multilayered structures composed of bi-anisotropic metamaterial slab and conventional materialen_US
dc.typearticleen_US
dc.relation.journalPhotonics and Nanostructures - Fundamentals and Applicationsen_US
dc.contributor.departmentBayburt Universityen_US
dc.contributor.authorID55885911000
dc.contributor.authorID7103318266
dc.contributor.authorID57198066553
dc.contributor.authorID6507145627
dc.contributor.authorID56186565500
dc.identifier.volume13
dc.identifier.startpage106
dc.identifier.endpage119
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US


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