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dc.contributor.authorHasar U.C.
dc.contributor.authorBarroso J.J.
dc.contributor.authorKaya Y.
dc.contributor.authorBute M.
dc.contributor.authorErtugrul M.
dc.date.accessioned20.04.201910:49:12
dc.date.accessioned2019-04-20T21:44:09Z
dc.date.available20.04.201910:49:12
dc.date.available2019-04-20T21:44:09Z
dc.date.issued2014
dc.identifier.issn0920-5071
dc.identifier.urihttps://dx.doi.org/10.1080/09205071.2014.896227
dc.identifier.urihttps://hdl.handle.net/20.500.12403/783
dc.description.abstractIn this research paper, we propose a simple procedure for accurate, stable and broadband measurements of complex permittivity of low-loss dielectric samples with considerable lengths. We identify and demonstrate by numerical and analytical analyses the main ill-behaved factor that gives rise to inaccurate peaks for measurements of electrical properties of low-loss samples in the well-known Nicolson-Ross-Weir method. Without using this factor in the expressions and combining better features of the methods available in the literature, the proposed procedure allows highly accurate permittivity measurements over a broad band. We have validated the proposed method by permittivity measurements of a low-loss sample by different methods. © 2014 Taylor & Francis.en_US
dc.language.isoengen_US
dc.publisherVSP BV
dc.relation.isversionof10.1080/09205071.2014.896227
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectlow-loss samples
dc.subjectmaterials testing
dc.subjectmicrowave measurements
dc.subjectpermittivity
dc.subjectElectric properties
dc.subjectFrequency bands
dc.subjectMaterials testing
dc.subjectMicrowave measurement
dc.subjectNumerical methods
dc.subjectPermittivity
dc.subjectAnalytical analysis
dc.subjectBroadband measurements
dc.subjectComplex permittivity
dc.subjectComplex permittivity measurement
dc.subjectLow loss material
dc.subjectLow-loss
dc.subjectNicolson-Ross-Weir methods
dc.subjectResearch papers
dc.subjectPermittivity measurement
dc.subjectlow-loss samples
dc.subjectmaterials testing
dc.subjectmicrowave measurements
dc.subjectpermittivity
dc.subjectElectric properties
dc.subjectFrequency bands
dc.subjectMaterials testing
dc.subjectMicrowave measurement
dc.subjectNumerical methods
dc.subjectPermittivity
dc.subjectAnalytical analysis
dc.subjectBroadband measurements
dc.subjectComplex permittivity
dc.subjectComplex permittivity measurement
dc.subjectLow loss material
dc.subjectLow-loss
dc.subjectNicolson-Ross-Weir methods
dc.subjectResearch papers
dc.subjectPermittivity measurement
dc.titleSimple procedure for robust and accurate complex permittivity measurements of low-loss materials over a broad frequency banden_US
dc.typearticleen_US
dc.relation.journalJournal of Electromagnetic Waves and Applicationsen_US
dc.contributor.departmentBayburt Universityen_US
dc.contributor.authorID55885911000
dc.contributor.authorID7103318266
dc.contributor.authorID57198066553
dc.contributor.authorID55900943000
dc.contributor.authorID56186565500
dc.identifier.volume28
dc.identifier.issue8
dc.identifier.startpage903
dc.identifier.endpage915
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US


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