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dc.contributor.authorHasar U.C.
dc.contributor.authorKaya Y.
dc.contributor.authorBute M.
dc.contributor.authorBarroso J.J.
dc.contributor.authorErtugrul M.
dc.date.accessioned20.04.201910:49:12
dc.date.accessioned2019-04-20T21:44:18Z
dc.date.available20.04.201910:49:12
dc.date.available2019-04-20T21:44:18Z
dc.date.issued2014
dc.identifier.issn0034-6748
dc.identifier.urihttps://dx.doi.org/10.1063/1.4862047
dc.identifier.urihttps://hdl.handle.net/20.500.12403/825
dc.description.abstractAn attractive transmission-reflection method based on reference-plane invariant and thickness-independent expressions has been proposed for accurate and unique retrieval of complex permittivity of dielectric liquid samples. The method uses both branch-index-independent expressions and a restricted solution set for determining unique and fast complex permittivities. A 2D graphical method has been applied to demonstrate the operation and validation of the proposed method. A uncertainty analysis has been performed to monitor how the accuracy of the proposed method can be improved by a correct selection of sample holder properties. Scattering parameter measurements of two tested reference liquids (distilled water and methanol) have been carried out for comparison of various techniques with the proposed one when the reference-planes and sample thickness are not precisely known. We note from the comparison that whereas other techniques are seriously affected by imprecise knowledge of both reference-planes and sample thickness, the proposed method removes this restriction. © 2014 AIP Publishing LLC.en_US
dc.language.isoengen_US
dc.relation.isversionof10.1063/1.4862047
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectComplex permittivity
dc.subjectDistilled water
dc.subjectGraphical methods
dc.subjectImprecise knowledge
dc.subjectLiquid materials
dc.subjectMicrowave methods
dc.subjectSample thickness
dc.subjectScattering parameter measurement
dc.subjectDielectric liquids
dc.subjectScattering parameters
dc.subjectUncertainty analysis
dc.subjectPermittivity
dc.subjectComplex permittivity
dc.subjectDistilled water
dc.subjectGraphical methods
dc.subjectImprecise knowledge
dc.subjectLiquid materials
dc.subjectMicrowave methods
dc.subjectSample thickness
dc.subjectScattering parameter measurement
dc.subjectDielectric liquids
dc.subjectScattering parameters
dc.subjectUncertainty analysis
dc.subjectPermittivity
dc.titleMicrowave method for reference-plane-invariant and thickness-independent permittivity determination of liquid materialsen_US
dc.typearticleen_US
dc.relation.journalReview of Scientific Instrumentsen_US
dc.contributor.departmentBayburt Universityen_US
dc.contributor.authorID55885911000
dc.contributor.authorID57198066553
dc.contributor.authorID55900943000
dc.contributor.authorID7103318266
dc.contributor.authorID56186565500
dc.identifier.volume85
dc.identifier.issue1
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US


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