Filtre: Konu
Toplam kayıt 2, listelenen: 1-10
Atomic force microscopy (2) |
Energy gap (2) |
Refractive index (2) |
Substrates (2) |
Thin films (2) |
Band-gap values (1) |
Cauchy model (1) |
Crystal formation (1) |
Deposition (1) |
Field emission microscopes (1) |