Toplam kayıt 2, listelenen: 1-10

    Atomic force microscopy (2)
    Energy gap (2)
    Refractive index (2)
    Substrates (2)
    Thin films (2)
    Band-gap values (1)
    Cauchy model (1)
    Crystal formation (1)
    Deposition (1)
    Field emission microscopes (1)