Toplam kayıt 2, listelenen: 1-10

    Atomic force microscopy (2)
    Deposition (2)
    Optical properties (2)
    Surface properties (2)
    Thin films (2)
    Vacuum applications (2)
    Vacuum technology (2)
    Atomic force microscope images (1)
    Crystalline directions (1)
    Deposition angle (1)