Filtre: Konu
Toplam kayıt 12, listelenen: 1-10
Substrates (12) |
Vacuum applications (12) |
Vacuum technology (11) |
Thermionic vacuum arc (10) |
Thin films (10) |
Atomic force microscopy (8) |
Refractive index (8) |
Energy gap (7) |
Scanning electron microscopy (7) |
Optical properties (6) |