Filtre: Konu
Toplam kayıt 2, listelenen: 1-10
Atomic force microscopy (2) |
Optical properties (2) |
Scanning electron microscopy (2) |
Surface properties (2) |
Thin films (2) |
AFM image (1) |
Amorphous films (1) |
analytical equipment (1) |
Article (1) |
atomic force microscope (1) |