Filtre: Konu
Toplam kayıt 2, listelenen: 1-10
Atomic force microscopy (2) |
Energy gap (2) |
Optical properties (2) |
Scanning electron microscopy (2) |
Thin films (2) |
X ray diffraction (2) |
AFM (1) |
AFM image (1) |
Band structure (1) |
Compositional properties (1) |