Filtre: Konu
Toplam kayıt 1, listelenen: 1-10
AFM (1) |
Atomic force microscopy (1) |
Energy gap (1) |
FESEM (1) |
Germanium (1) |
Optical properties (1) |
Scanning electron microscopy (1) |
SiGe thin film (1) |
SiGe thin films (1) |
Silicon alloys (1) |
AFM (1) |
Atomic force microscopy (1) |
Energy gap (1) |
FESEM (1) |
Germanium (1) |
Optical properties (1) |
Scanning electron microscopy (1) |
SiGe thin film (1) |
SiGe thin films (1) |
Silicon alloys (1) |