Filtre: Konu
Toplam kayıt 2, listelenen: 1-10
| Atomic force microscopy (2) |
| Energy gap (2) |
| Optical properties (2) |
| Scanning electron microscopy (2) |
| Thin films (2) |
| X ray diffraction (2) |
| AFM (1) |
| AFM image (1) |
| Band structure (1) |
| Compositional properties (1) |
