Filtre: Konu
Toplam kayıt 3, listelenen: 1-10
Atomic force microscopy (3) |
Energy gap (3) |
Magnetron sputtering (3) |
Thin films (3) |
Glass substrates (2) |
Optical properties (2) |
Oxide films (2) |
Radio frequency magnetron sputtering (2) |
Refractive index (2) |
rf-Magnetron sputtering (2) |