Filtre: Konu
Toplam kayıt 3, listelenen: 1-10
Atomic force microscopy (3) |
Optical properties (3) |
Thin films (3) |
Energy gap (2) |
Magnetron sputtering (2) |
Oxide films (2) |
Radio frequency magnetron sputtering (2) |
Refractive index (2) |
Scanning electron microscopy (2) |
Substrates (2) |