Filtre: Konu
Toplam kayıt 3, listelenen: 1-10
Atomic force microscopy (3) |
Optical properties (3) |
Thin films (3) |
Energy gap (2) |
Magnetron sputtering (2) |
Oxide films (2) |
Radio frequency magnetron sputtering (2) |
AFM image (1) |
Al-doping (1) |
Aluminum coatings (1) |