Filtre: Konu
Toplam kayıt 5, listelenen: 1-10
Atomic force microscopy (5) |
Energy gap (5) |
Optical properties (4) |
Magnetron sputtering (3) |
Oxide films (3) |
Refractive index (3) |
Surface properties (3) |
Thin films (3) |
Electric batteries (2) |
Field emission microscopes (2) |