Yazar "Hasar U.C." için listeleme
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Attractive method for thickness-independent permittivity measurements of solid dielectric materials
Hasar U.C.; Barroso J.J.; Bute M.; Kaya Y.; Kocadagistan M.E.; Ertugrul M. (2014)We propose a non-resonant-type method for reference-plane invariant and thickness-independent permittivity measurement of solid dielectric materials when there is no information from permittivity. To achieve this, we derive ... -
Determination of effective constitutive parameters of inhomogeneous metamaterials with bianisotropy
Hasar U.C.; Buldu G.; Kaya Y.; Ozturk G. (Institute of Electrical and Electronics Engineers Inc., 2018)A recursive algorithm is proposed to accurately extract the electromagnetic parameters of isotropic/bianisotropic metamaterial (MM) slabs of inhomogeneous structures. The algorithm is based on the recursive calculations ... -
Determination of Reference-Plane Invariant, Thickness-Independent, and Broadband Constitutive Parameters of Thin Materials
Hasar U.C.; Kaya Y.; Barroso J.J.; Ertugrul M. (Institute of Electrical and Electronics Engineers Inc., 2015)We propose an effective microwave method for reference-plane-invariant and thickness-independent constitutive parameters measurement of thin materials. A function depending only on the interface reflection coefficient to ... -
Investigation of transmitted, reflected, and absorbed powers of periodic and aperiodic multilayered structures composed of bi-anisotropic metamaterial slab and conventional material
Hasar U.C.; Barroso J.J.; Kaya Y.; Karacali T.; Ertugrul M. (Elsevier, 2015)In this study, we investigate transmitted, reflected, and absorbed powers in forward and backward directions of periodic and aperiodic multilayered structures composed of bi-anisotropic metamaterial (MM) slab and conventional ... -
Microwave method for reference-plane-invariant and thickness-independent permittivity determination of liquid materials
Hasar U.C.; Kaya Y.; Bute M.; Barroso J.J.; Ertugrul M. (2014)An attractive transmission-reflection method based on reference-plane invariant and thickness-independent expressions has been proposed for accurate and unique retrieval of complex permittivity of dielectric liquid samples. ... -
Noniterative complex permittivity retrieval using calibration-independent waveguide measurements
Hasar U.C.; Kaya Y. (Elsevier B.V., 2017)Calibration-independent nonresonant measurements can be employed to eliminate the need for calibration before microwave measurements. These methods generally assume that the location of the sample in its measurement cell ... -
Power analysis of multilayer structures composed of conventional materials and bi-anisotropic metamaterial slabs
Hasar U.C.; Bute M.; Barroso J.J.; Sabah C.; Kaya Y.; Ertugrul M. (Optical Society of America, 2014)In this paper, we analyze wave propagation properties (transmitted, reflected, and absorbed powers) of composite multilayer structures consisting of bi-anisotropic metamaterial (MM) slabs and conventional isotropic materials. ... -
Reference-plane invariant transmission-reflection method for measurement of constitutive parameters of liquid materials
Hasar U.C.; Barroso J.J.; Kaya Y.; Ertugrul M.; Bute M. (2013)We propose a new transmission-reflection method for measuring constitutive parameters of liquid samples inside an asymmetric measurement cell (a sample over a low-loss holder in vertical position inside an empty waveguide ... -
Reference-Plane-Invariant Effective Thickness and Electromagnetic Property Determination of Isotropic Metamaterials Involving Boundary Effects
Hasar U.C.; Barroso J.J.; Buldu G.; Bute M.; Kaya Y.; Karacali T.; Ertugrul M. (Institute of Electrical and Electronics Engineers Inc., 2015)It is well recognized that near-field effects become dominant when the metamaterial (MM) is in resonance. In addition, any inaccurate information of the location of reference planes, and the effective length can seriously ... -
Self-Calibrating Noniterative Complex Permittivity Extraction of Thin Dielectric Samples
Hasar U.C.; Kaya Y. (Institute of Electrical and Electronics Engineers Inc., 2018)A microwave method relying on uncalibrated scattering (S-) parameters is proposed to measure the complex permittivity (?r) of thin dielectric samples. It has the following two main advantages. First, it takes into account ... -
Simple procedure for robust and accurate complex permittivity measurements of low-loss materials over a broad frequency band
Hasar U.C.; Barroso J.J.; Kaya Y.; Bute M.; Ertugrul M. (VSP BV, 2014)In this research paper, we propose a simple procedure for accurate, stable and broadband measurements of complex permittivity of low-loss dielectric samples with considerable lengths. We identify and demonstrate by numerical ... -
Two-step numerical procedure for complex permittivity retrieval of dielectric materials from reflection measurements
Hasar U.C.; Barroso J.J.; Kaya Y.; Ertugrul M.; Bute M.; Catalá-Civera J.M. (Springer Verlag, 2014)A two-step measurement procedure has been proposed for measurement of complex permittivity of dielectric materials using one-port reflection measurements. In the procedure, as a first step, a graphical method is applied ...