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Effect of XRD relative intensities of the Li (002) on surface, optical and electrochemical impedance spectroscopy analyses of the deposited LiCoO2 thin film

Yudar H.H.; Pat S.; Özen S.; Şenay V.; Korkmaz Ş.; Pat Z. (Springer New York LLC, 2017)

In this paper, the effect of RF power on LiCoO2 thin films was investigated using X-ray diffractometer (XRD), atomic force microscopy, UV–Vis spectrophotometer, and potentiostat. The microstructural, surface, optical and ...

Zn/ZnSe thin films deposition by RF magnetron sputtering

Yudar H.H.; Pat S.; Korkmaz Ş.; Özen S.; Şenay V. (Springer New York LLC, 2017)

In this paper, Zn/ZnSe thin films were deposited on glass substrates by RF magnetron sputtering system. XRD analyses were done. Zn and ZnSe phases were obtained. Miller indices of obtained Zn phases were detected in (320), ...

The substrate effect on Ge doped GaN thin films coated by thermionic vacuum arc

Özen S.; Korkmaz Ş.; Şenay V.; Pat S. (Springer New York LLC, 2017)

This study focuses on characterization and understanding of the substrate effect on Ge doped GaN thin films coated onto transparent substrates. The produced films were deposited onto unheated glass and unheated polyethylene ...

A study on some physical properties of a Pb-doped GaAs thin film produced by thermionic vacuum arc

Şenay V.; Özen S.; Pat S.; Korkmaz Ş. (Elsevier Ltd, 2017)

A 155 nm Pb-doped GaAs thin film was deposited on a glass substrate by means of the thermionic vacuum arc technique in 30 s using GaAs and Pb pellets as source materials. Tools and techniques such as an optical reflectometer, ...