Yazar "Şenay, Volkan" seçeneğine göre listele

Listeleniyor 1 - 4 / 4
  • Küçük Resim Yok
    Öğe
    Gold/palladium (Au/Pd) Bimetallic Thin Film Deposition by Radio Frequency Magnetron Sputtering Technique
    (2019) Şenay, Volkan
    In this study, two gold/palladium (Au/Pd) thin films having 20 nm and 80 nm thicknessvalues were simultaneously deposited on glass substrates by adjusting target-substrate distance viaradio frequency (RF) magnetron sputtering technique. The optical and surface properties of theproduced thin films were investigated by using UV-VIS spectrophotometer, interferometer,tensiometer and atomic force microscope. The effects of film thickness on the investigated propertiesof the thin films were reported.
  • Küçük Resim Yok
    Öğe
    Optical and Surface Properties of Nanostructured ZnO Semiconductor Thin Films Synthesized by RF Magnetron Sputtering
    (2019) Şenay, Volkan
    In this research, ZnO thin films were deposited on glass microscope slides in three separate experiments with RF inputpowers of 50 W, 100 W and 125 W by means of RF magnetron sputtering technique. Each deposition process wasconducted for 30 minutes. Spectroscopic reflectometer, UV-VIS spectrophotometer and atomic force microscope(AFM) were used to examine the effect of sputtering power on the optical and surface properties of the produced thinfilms. The level of reflectivity and transparency, refractive index and band gap energy values as well as surfacehomogeneity and roughness were observed to rely on the RF input power. The optical band gap energy values wereabout 3.83-3.87 eV. The produced highly transparent ZnO thin films can be used in various optoelectronic devices andfuture transparent conductive electrode implementations.
  • Küçük Resim Yok
    Öğe
    RF ve DC Magnetron Püskürtme Tekniği ile Büyütülmüş Ni Katkılı ?-Fe2O3 İnce Filmin Optik, Yapısal ve Morfolojik Özellikleri
    (2025) Salari, Maryam Abdolahpour; Muğlu, Günay Merhan; Şenay, Volkan; Sarıtaş, Sevda
    Bu araştırmada, doğru akım (DC) ve radyo frekansı (RF) magnetron püskürtme tekniği kullanılarak cam alttaş üzerinde Ni katkılı hematit (?- Fe2O3) ince film sentezlenmiştir ve üretilen filmin birçok fiziksel özellikleri araştırılmıştır. Elde edilen Ni katkılı ?-Fe2O3 ince filmin optik, yapısal ve morfolojik analizleri, UV-VIS spektroskopisi, EDX, X-ışını kırınımı (XRD), taramalı elektron mikroskobu (SEM) ve atomik kuvvet mikroskobu (AFM) kullanılarak belirlenmiştir. Absorbsiyon ölçümüne dayanarak, ince filmin bant aralığı enerji değeri 2,12 eV olarak hesaplanmıştır. XRD analizi, incelenen ince filmin nanokristalin yapıya sahip olduğunu göstermiştir. SEM görüntüsüne göre ince film alttaş boyunca düzgün bir yüzey morfolojisi sergilemiştir. Ayrıca AFM görüntüleri, düşük bir RMS pürüzlülük değeri ortaya koymuştur ve bu da Ni katkılı Fe2O3 ince filminin pürüzsüz bir yüzeye sahip olduğunu göstermektedir.
  • Küçük Resim Yok
    Öğe
    Some Physical Attributes of a Cr-Doped Iron Oxide Thin Film Produced by Simultaneous RF and DC Magnetron Sputtering Technique
    (2025) Muğlu, Günay Merhan; Salari, Maryam Abdolahpour; Şenay, Volkan; Sarıtaş, Sevda
    Iron oxide has recently attracted considerable interest because of its diverse structural and morphological configurations, leading to progressions in various technologies, including ultrahigh magnetic storage, magneto-optical sensors, humidity sensors, and gas sensors. In this research, a thin film of iron oxide doped with chromium was produced on a glass substrate using simultaneous RF and DC magnetron sputtering. The resulting thin film's optical, structural, elemental, and surface characteristics were thoroughly investigated using UV-VIS spectroscopy, XRD, XPS, AFM, and SEM. XRD was utilized to examine the structure of the thin film, which demonstrated good crystallinity. Notably, prominent diffraction peaks at various angles corresponded to specific planes of the normal hematite phase of Fe2O3, as verified by the JCPDS Card No. 33-0664. A significant peak at (104) indicated a sturdy development of the hematite phase. The XPS spectrum analysis approved the presence of iron, oxygen, and chromium in the thin film. This study, known for its straightforward methodology, provides valuable insights into the chromium impurity doping process of Fe2O3, contributing to a deeper understanding of its structural and morphological characteristics.