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Öğe Evaluation of electromagnetic interference emitted from compact fluorescent lamps according to CISPR-15(Electromagnetics Academy, 2015) Kocakusak A.; Cakir M.; Yalcin S.; Ozen S.; Helhel S.In this study, Electromagnetic interference (EMI) emitted by the compact fluorescent lamps (CFL) having biggest pie in the market has been investigated according to CISPR-15. Emissions of CFLs vary depending on trademark, since some cannot provide the requirements of CISPR-15 standards such that they act as contaminants in the electric supply system. Conducted analysis considering the limits of CISPR-15 at 150-500 kHz frequency brings out that the effect of CFL produced by Company A at 181.298 kHz is 83.94 dB?V, whereas the effect of CFL produced by Company D at 173.593kHz frequency is 49,92dB?V, respectively. Obtained results are out of CISPR-15 limits of 66-56 dB?V.Öğe Morphological and optical comparison of the Si doped GaN thin film deposited onto the transparent substrates(Institute of Physics Publishing, 2016) Ozen S.; Senay V.; Pat S.; Korkmaz S.The aim of this paper is to expand the body of knowledge about the silicon doped gallium nitride thin films deposited on different substrates. The physical properties of the Si doped GaN thin films deposited on the glass and polyethylene terephthalate substrates by thermionic vacuum arc which is plasma production technique were investigated. Thermionic vacuum arc method is a method of producing pure material plasma. The Si doped GaN thin films were analyzed using the following methods and the devices: atomic force microscopy, X-ray diffraction device, spectroscopic ellipsometer and energy dispersive X-ray spectroscopy detector. The produced Si doped GaN thin films are in the (113) orientation. The thicknesses and refractive index were determined by using Cauchy dispersion model. Surface morphologies of produced thin films are homogenous and low roughness. Our analysis showed that the thermionic vacuum arc method present important advantages for optical and industrial applications. © 2016 IOP Publishing Ltd.