Yazar "Stoyanov, Ivaylo" seçeneğine göre listele

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    A Hybrid Retrieval Method for an -Class Bianisotropic Metamaterial Using Scattering Parameter Method
    (Ieee-Inst Electrical Electronics Engineers Inc, 2025) Ozturk, Gokhan; Hasar, Ugur Cem; Kaya, Yunus; Korkmaz, Huseyin; Stoyanov, Ivaylo
    In this study, a hybrid retrieval method is proposed to retrieve all terms in the electric and magnetic tensors (along with coupling tensors) of Omega-class bianisotropic metamaterial (MM) slabs using scattering (S-) parameters of both normal incidence TE2 mode and oblique incidence TM2 and TE modes. Compared with other extraction methods in the literature, our retrieval method fully characterizes the MM slab (extracts all constitutive parameters) without necessitating any numerical technique (non-iterative) using fewer wave configurations (two modes) and sample configurations (one configuration). Contrary to two sample configurations required in the application of previous retrieval methods in the literature, one sample configuration (with and without its rotation in the transverse plane) significantly decreases the effect of fabrication tolerances on the accuracy of extraction. The proposed extraction method is first validated by a bulk MM slab synthesized by the Lorentz and Drude models. Then, it is applied for extracting the electromagnetic properties of two bianisotropic MM slabs in the form of square split-ring-resonators and Omega-shape using their S-parameters simulated by a full wave simulation program. Finally, its accuracy is examined by comparing simulated S-parameters with those reconstructed by using extracted electromagnetic parameters. It is observed that our proposed method determines the constitutive parameters with a relatively higher accuracy in a relatively short amount of time.
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    Simpler Reference-Plane-Invariant Method for Permittivity Extraction of Medium- or Low-Loss Dielectric Samples Using One-Port Measurements
    (Ieee-Inst Electrical Electronics Engineers Inc, 2024) Hasar, Ugur Cem; Ali, Husain; Kaya, Yunus; Stoyanov, Ivaylo
    A microwave method is devised to extract relative complex permittivity ( $\varepsilon _{r}$ ) of medium- or low-loss dielectric samples. It is simpler, non-iterative, reference-plane-invariant (RPI), and applicable for one-port waveguide measurements with short-circuit termination only. Besides, since it uses short-circuit termination reflection-only measurements, it is free from Fabry-P & eacute;rot resonances. Permittivity measurements of polyvinyl chloride (PVC) and polypropylene (PP) are performed at X-band ( $8.2-12.4$ GHz) to examine the performance of the proposed method considering different scenarios involving inaccurate information of sample location in the cell and inaccurate knowledge of the sample thickness. Repeatability analysis is carried out to analyze the performance of the proposed method against other similar methods in the literature.