Simpler Reference-Plane-Invariant Method for Permittivity Extraction of Medium- or Low-Loss Dielectric Samples Using One-Port Measurements
Küçük Resim Yok
Tarih
2024
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
Ieee-Inst Electrical Electronics Engineers Inc
Erişim Hakkı
info:eu-repo/semantics/openAccess
Özet
A microwave method is devised to extract relative complex permittivity ( $\varepsilon _{r}$ ) of medium- or low-loss dielectric samples. It is simpler, non-iterative, reference-plane-invariant (RPI), and applicable for one-port waveguide measurements with short-circuit termination only. Besides, since it uses short-circuit termination reflection-only measurements, it is free from Fabry-P & eacute;rot resonances. Permittivity measurements of polyvinyl chloride (PVC) and polypropylene (PP) are performed at X-band ( $8.2-12.4$ GHz) to examine the performance of the proposed method considering different scenarios involving inaccurate information of sample location in the cell and inaccurate knowledge of the sample thickness. Repeatability analysis is carried out to analyze the performance of the proposed method against other similar methods in the literature.
Açıklama
Anahtar Kelimeler
Solids, Economic indicators, Permittivity measurement, Calibration, Reflection, Permittivity, Liquids, Iterative methods, Electromagnetics, Accuracy, Material characterization, non-iterative, one-port measurement, permittivity, short-termination
Kaynak
Ieee Access
WoS Q Değeri
Q2
Scopus Q Değeri
Q1
Cilt
12
