Simpler Reference-Plane-Invariant Method for Permittivity Extraction of Medium- or Low-Loss Dielectric Samples Using One-Port Measurements

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dc.authorid0000-0002-3573-7884
dc.authorid0000-0002-6098-7762
dc.authorid0000-0001-9824-1504
dc.contributor.authorHasar, Ugur Cem
dc.contributor.authorAli, Husain
dc.contributor.authorKaya, Yunus
dc.contributor.authorStoyanov, Ivaylo
dc.date.accessioned2026-02-28T12:17:59Z
dc.date.available2026-02-28T12:17:59Z
dc.date.issued2024
dc.departmentBayburt Üniversitesi
dc.description.abstractA microwave method is devised to extract relative complex permittivity ( $\varepsilon _{r}$ ) of medium- or low-loss dielectric samples. It is simpler, non-iterative, reference-plane-invariant (RPI), and applicable for one-port waveguide measurements with short-circuit termination only. Besides, since it uses short-circuit termination reflection-only measurements, it is free from Fabry-P & eacute;rot resonances. Permittivity measurements of polyvinyl chloride (PVC) and polypropylene (PP) are performed at X-band ( $8.2-12.4$ GHz) to examine the performance of the proposed method considering different scenarios involving inaccurate information of sample location in the cell and inaccurate knowledge of the sample thickness. Repeatability analysis is carried out to analyze the performance of the proposed method against other similar methods in the literature.
dc.description.sponsorshipEuropean Union-NextGeneration EU, through the National Recovery and Resilience Plan of the Republic of Bulgaria [BG-RRP-2.013-0001-C01]
dc.description.sponsorshipThis work was supported in part by the European Union-NextGeneration EU, through the National Recovery and Resilience Plan of the Republic of Bulgaria, under Project BG-RRP-2.013-0001-C01.
dc.identifier.doi10.1109/ACCESS.2024.3479311
dc.identifier.endpage151074
dc.identifier.issn2169-3536
dc.identifier.scopus2-s2.0-85207708999
dc.identifier.scopusqualityQ1
dc.identifier.startpage151063
dc.identifier.urihttps://doi.org/10.1109/ACCESS.2024.3479311
dc.identifier.urihttps://hdl.handle.net/20.500.12403/6061
dc.identifier.volume12
dc.identifier.wosWOS:001340691800001
dc.identifier.wosqualityQ2
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherIeee-Inst Electrical Electronics Engineers Inc
dc.relation.ispartofIeee Access
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/openAccess
dc.snmzKA_WoS_20260218
dc.subjectSolids
dc.subjectEconomic indicators
dc.subjectPermittivity measurement
dc.subjectCalibration
dc.subjectReflection
dc.subjectPermittivity
dc.subjectLiquids
dc.subjectIterative methods
dc.subjectElectromagnetics
dc.subjectAccuracy
dc.subjectMaterial characterization
dc.subjectnon-iterative
dc.subjectone-port measurement
dc.subjectpermittivity
dc.subjectshort-termination
dc.titleSimpler Reference-Plane-Invariant Method for Permittivity Extraction of Medium- or Low-Loss Dielectric Samples Using One-Port Measurements
dc.typeArticle

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