Analysis of optical, structural, and morphological properties of a Ti-doped ?-Fe2O3 thin film produced through RF and DC magnetron Co-sputtering

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dc.contributor.authorSalari, Maryam Abdolahpour
dc.contributor.authorMuglu, Guenay Merhan
dc.contributor.authorSenay, Volkan
dc.contributor.authorSaritas, Sevda
dc.contributor.authorKundakci, Mutlu
dc.date.accessioned2024-10-04T18:48:14Z
dc.date.available2024-10-04T18:48:14Z
dc.date.issued2024
dc.departmentBayburt Üniversitesien_US
dc.description.abstractIn this study, a Titanium (Ti) doped alpha-Fe2O3 (hematite) thin layer was synthesized onto a glass substrate, employing the simultaneous DC and RF magnetron sputtering method. The investigation focused on examining specific physical properties of the film. The optical, structural, morphological, and elemental features of the resulting Ti-doped alpha-Fe2O3 thin film were characterized using different characterization techniques. The XRD studies indicated a rhombohedral crystal structure in the studied thin film. The calculation of the Eg value for the thin film, based on absorption measurements, resulted in a value of 2.19 eV. Raman peaks were identified within the range of 218 cm(-1) to 1300 cm(-1). According to SEM images, the thin film exhibited a uniform surface morphology across the substrate. AFM images revealed a low root mean square (RMS) roughness value, indicating a smooth Ti:Fe2O3 thin film surface.en_US
dc.description.sponsorshipAtatuerk University Scientific Research Projects Coordination Department [FBA-2020-8217]en_US
dc.description.sponsorshipThe authors would like to thank the Atatuerk University Scientific Research Projects Coordination Department under the Grant No. FBA-2020-8217 for the supports.en_US
dc.identifier.doi10.1016/j.ceramint.2024.07.291
dc.identifier.endpage39225en_US
dc.identifier.issn0272-8842
dc.identifier.issn1873-3956
dc.identifier.issue20en_US
dc.identifier.scopus2-s2.0-85199774956en_US
dc.identifier.scopusqualityQ1en_US
dc.identifier.startpage39221en_US
dc.identifier.urihttps://doi.org/10.1016/j.ceramint.2024.07.291
dc.identifier.urihttp://hdl.handle.net/20.500.12403/2980
dc.identifier.volume50en_US
dc.identifier.wosWOS:001308038400001en_US
dc.identifier.wosqualityN/Aen_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherElsevier Sci Ltden_US
dc.relation.ispartofCeramics Internationalen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectTitanium dopingen_US
dc.subjectalpha-Fe2O3en_US
dc.subjectRamanen_US
dc.subjectAFMen_US
dc.subjectSEMen_US
dc.titleAnalysis of optical, structural, and morphological properties of a Ti-doped ?-Fe2O3 thin film produced through RF and DC magnetron Co-sputteringen_US
dc.typeArticleen_US

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