Machine Learning-Based Material Thickness and Type Classification via Scattering Parameters
Küçük Resim Yok
Tarih
2025
Yazarlar
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
Mdpi
Erişim Hakkı
info:eu-repo/semantics/openAccess
Özet
The precise determination of material type and thickness is of major significance in non-destructive testing, quality assurance, and materials science, as it influences the functionality, reliability, and performance of materials in engineering applications. This study proposes a methodology for the classification of material thickness and type through the analysis of scattering parameters within the 8-12 GHz frequency range. A database was created, encompassing real, imaginary, and dB values of reflection and transmission parameters for nine real-world materials with thicknesses ranging from 1 to 10 mm. This study addressed two main classification tasks, namely material thickness and material type. A variety of training-testing splits were employed in conjunction with 10-fold cross-validation to facilitate a comparison of classifier performance. In the material type classification, incorporating multiple thickness levels of each material enabled the model to distinguish materials with similar reflection characteristics more accurately, thereby enhancing discrimination performance. The results showed that Fine KNN consistently achieved 100% accuracy in thickness classification, while Quadratic SVM achieved 100% accuracy in material type classification, even when utilising only three thickness levels. Furthermore, the 90% training-10% testing split yielded the highest performance in thickness classification, whereas the optimal data split for material type classification differed across classifiers. Overall, this study demonstrates that the combination of scattering parameters and machine learning serves as a reliable and efficient approach for non-destructive material characterization.
Açıklama
Anahtar Kelimeler
thickness classification, material identification, non-destructive testing, scattering parameters, machine learning
Kaynak
Applied Sciences-Basel
WoS Q Değeri
Q2
Scopus Q Değeri
Q1
Cilt
16
Sayı
1
