Self-Calibrating Noniterative Complex Permittivity Extraction of Thin Dielectric Samples

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dc.authorid55885911000
dc.authorid57198066553
dc.contributor.authorHasar U.C.
dc.contributor.authorKaya Y.
dc.date.accessioned20.04.201910:49:12
dc.date.accessioned2019-04-20T21:43:06Z
dc.date.available20.04.201910:49:12
dc.date.available2019-04-20T21:43:06Z
dc.date.issued2018
dc.departmentBayburt Üniversitesien_US
dc.description.abstractA microwave method relying on uncalibrated scattering (S-) parameters is proposed to measure the complex permittivity (?r) of thin dielectric samples. It has the following two main advantages. First, it takes into account effect of the sample holder, used for holding the sample, especially important for thin sample electromagnetic property characterization. Second, it does not require any specific information about the location of the sample (and its holder) inside its measurement cell for ?r extraction. For validation of our method, we applied a commercial three-dimensional electromagnetic simulation program-CST Microwave Studio-and the Lorentz dispersion model. Uncalibrated (as well as calibrated) S-parameter measurements were conducted to measure ?r of a 0.7 mm thick polyethylene sample (the sample holder was a 5.18 mm thick PVC sample) by our method and other similar methods in the literature. From the comparison, we observed that while the accuracy of tested methods significantly changed with inaccurate knowledge of the sample position inside its cell, the accuracy of our method did not much alter. © 1964-2012 IEEE.en_US
dc.identifier.doi10.1109/TEMC.2017.2715161
dc.identifier.endpage361
dc.identifier.issn0018-9375
dc.identifier.issue2
dc.identifier.scopus2-s2.0-85022051624en_US
dc.identifier.scopusqualityQ1en_US
dc.identifier.startpage354
dc.identifier.urihttps://dx.doi.org/10.1109/TEMC.2017.2715161
dc.identifier.urihttps://hdl.handle.net/20.500.12403/390
dc.identifier.volume60
dc.identifier.wosWOS:000414682600007en_US
dc.identifier.wosqualityQ2en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.
dc.relation.ispartofIEEE Transactions on Electromagnetic Compatibilityen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectConstitutive parameters
dc.subjectnoniterative
dc.subjectposition-invariant
dc.subjectself-calibration
dc.subjectCalibration
dc.subjectParameter estimation
dc.subjectPermittivity
dc.subjectPermittivity measurement
dc.subjectPosition measurement
dc.subjectAntenna measurement
dc.subjectConstitutive parameters
dc.subjectElectromagnetics
dc.subjectFrequency measurements
dc.subjectNon-iterative
dc.subjectposition-invariant
dc.subjectSelf calibration
dc.subjectExtraction
dc.subjectConstitutive parameters
dc.subjectnoniterative
dc.subjectposition-invariant
dc.subjectself-calibration
dc.subjectCalibration
dc.subjectParameter estimation
dc.subjectPermittivity
dc.subjectPermittivity measurement
dc.subjectPosition measurement
dc.subjectAntenna measurement
dc.subjectConstitutive parameters
dc.subjectElectromagnetics
dc.subjectFrequency measurements
dc.subjectNon-iterative
dc.subjectposition-invariant
dc.subjectSelf calibration
dc.subjectExtraction
dc.titleSelf-Calibrating Noniterative Complex Permittivity Extraction of Thin Dielectric Samplesen_US
dc.typeArticleen_US

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