Reference-plane invariant transmission-reflection method for measurement of constitutive parameters of liquid materials

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dc.authorid55885911000
dc.authorid7103318266
dc.authorid57198066553
dc.authorid56186565500
dc.authorid55900943000
dc.contributor.authorHasar U.C.
dc.contributor.authorBarroso J.J.
dc.contributor.authorKaya Y.
dc.contributor.authorErtugrul M.
dc.contributor.authorBute M.
dc.date.accessioned20.04.201910:49:12
dc.date.accessioned2019-04-20T21:44:21Z
dc.date.available20.04.201910:49:12
dc.date.available2019-04-20T21:44:21Z
dc.date.issued2013
dc.departmentBayburt Üniversitesien_US
dc.description.abstractWe propose a new transmission-reflection method for measuring constitutive parameters of liquid samples inside an asymmetric measurement cell (a sample over a low-loss holder in vertical position inside an empty waveguide section). We derived reference-plane invariant expressions for constitutive parameters measurement of liquid samples from reference-plane dependent scattering parameters. In addition, we also applied a simple approach for unique determination of transformation factor and reference-plane distances. After, we also investigated how the performance of the proposed method could be improved by performing a differential uncertainty analysis. From this analysis, we found the following key results: (a) the accuracy of the proposed method could be enhanced for low-loss liquid samples by using thicker samples, and (b) the effect of constitutive parameters and the length of the (low-loss) sample holder on constitutive parameters measurements of liquid samples by the proposed method is a key parameter in increasing the accuracy of the measurements. Finally, we performed constitutive parameter measurements of distilled water and methanol to validate the proposed method and compared the proposed method with similar methods in the literature. From the measurements, we note that our method is especially useful for liquid sample measurements when the reference-plane transformation factors are not known a priori and/or if the measurements are carried out over a high frequency range. © 2013 Elsevier B.V.en_US
dc.identifier.doi10.1016/j.sna.2013.09.007
dc.identifier.endpage354
dc.identifier.issn0924-4247
dc.identifier.scopus2-s2.0-84886429476en_US
dc.identifier.scopusqualityQ1en_US
dc.identifier.startpage346
dc.identifier.urihttps://dx.doi.org/10.1016/j.sna.2013.09.007
dc.identifier.urihttps://hdl.handle.net/20.500.12403/837
dc.identifier.volume203
dc.identifier.wosWOS:000327916300045en_US
dc.identifier.wosqualityQ1en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.relation.ispartofSensors and Actuators, A: Physicalen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectLiquid materials
dc.subjectMaterial characterization
dc.subjectMeasurement of dielectric and magnetic materials
dc.subjectMicrowavemeasurements
dc.subjectReference-plane invariant
dc.subjectConstitutive parameters
dc.subjectFrequency ranges
dc.subjectLiquid materials
dc.subjectLow-loss liquids
dc.subjectMaterial characterizations
dc.subjectMeasurement cell
dc.subjectReference-plane invariant
dc.subjectVertical positions
dc.subjectCharacterization
dc.subjectDielectric materials
dc.subjectLiquids
dc.subjectMagnetic materials
dc.subjectMeasurements
dc.subjectMicrowave measurement
dc.subjectScattering parameters
dc.subjectUncertainty analysis
dc.subjectParameter estimation
dc.subjectLiquid materials
dc.subjectMaterial characterization
dc.subjectMeasurement of dielectric and magnetic materials
dc.subjectMicrowavemeasurements
dc.subjectReference-plane invariant
dc.subjectConstitutive parameters
dc.subjectFrequency ranges
dc.subjectLiquid materials
dc.subjectLow-loss liquids
dc.subjectMaterial characterizations
dc.subjectMeasurement cell
dc.subjectReference-plane invariant
dc.subjectVertical positions
dc.subjectCharacterization
dc.subjectDielectric materials
dc.subjectLiquids
dc.subjectMagnetic materials
dc.subjectMeasurements
dc.subjectMicrowave measurement
dc.subjectScattering parameters
dc.subjectUncertainty analysis
dc.subjectParameter estimation
dc.titleReference-plane invariant transmission-reflection method for measurement of constitutive parameters of liquid materialsen_US
dc.typeArticleen_US

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