Optical, morphological and mechanical properties of an Al-Al2O3 nanocomposite thin film grown by thermionic vacuum arc

Küçük Resim Yok

Tarih

2016

Dergi Başlığı

Dergi ISSN

Cilt Başlığı

Yayıncı

Elsevier GmbH

Erişim Hakkı

info:eu-repo/semantics/closedAccess

Özet

An Al-Al2O3 nanocomposite thin film was deposited onto a glass substrate in high vacuum condition using Al2O3 pellets as source material by means of the thermionic vacuum arc technique in just 50 s. UV-visible spectrophotometer, optical reflectometer, spectroscopic ellipsometer, XRD, FESEM and AFM were employed to investigate the optical, structural morphological and mechanical properties of the produced film. The film exhibited a high transmittance (above 80%) in the 400-1000 nm region. The dispersion of the refractive index was discussed in terms of the single oscillator model. The optical band gap value derived from the Wemple-DiDomenico dispersion relationship was 5.7 eV. It was observed that the results of the optical investigations agreed well with Al2O3 thin films. XRD characterization showed that the film contained Al and Al2O3 phases. The FESEM analysis revealed that the film morphology had a dense characteristic. 2D and 3D AFM micrographs indicated a smooth surface with a low value of average roughness. When compared to the mechanical properties of Al2O3 thin films, it was observed that the hardness and Young's modulus reduced due to presence of ductile Al particles. © 2015 Elsevier GmbH. All rights reserved. All rights reserved.

Açıklama

Anahtar Kelimeler

AFM, Al-Al2O3 nanocomposite, FESEM, Thermionic vacuum arc, XRD, Dispersion (waves), Elastic moduli, Energy gap, Mechanical properties, Nanocomposite films, Nanocomposites, Reflectometers, Refractive index, Substrates, Thin films, Vacuum applications, Vacuum technology, AFM, Dispersion relationship, FESEM, Nanocomposite thin films, Spectroscopic ellipsometers, Thermionic vacuum arc, UV-visible spectrophotometer, XRD, Aluminum, AFM, Al-Al2O3 nanocomposite, FESEM, Thermionic vacuum arc, XRD, Dispersion (waves), Elastic moduli, Energy gap, Mechanical properties, Nanocomposite films, Nanocomposites, Reflectometers, Refractive index, Substrates, Thin films, Vacuum applications, Vacuum technology, AFM, Dispersion relationship, FESEM, Nanocomposite thin films, Spectroscopic ellipsometers, Thermionic vacuum arc, UV-visible spectrophotometer, XRD, Aluminum

Kaynak

Optik

WoS Q Değeri

Q4

Scopus Q Değeri

Q2

Cilt

127

Sayı

6

Künye