Effect of sample deformation in longitudinal axis on material parameter extraction by waveguides

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dc.authoridKaya, Yunus/0000-0002-2380-5915
dc.authoridHasar, Ugur Cem/0000-0002-6098-7762
dc.contributor.authorHasar, Ugur Cem
dc.contributor.authorKaya, Yunus
dc.contributor.authorOzturk, Gokhan
dc.contributor.authorErtugrul, Mehmet
dc.date.accessioned2024-10-04T18:49:36Z
dc.date.available2024-10-04T18:49:36Z
dc.date.issued2021
dc.departmentBayburt Üniversitesien_US
dc.description.abstractAn analysis was performed for examining the consequences of sample deformation in longitudinal axis in the sample-loaded non-resonant waveguide techniques. Vertical and horizontal deformations were first simulated to understand the change in field distributions and corresponding scattering parameters. Then, effects of sample length, dielectric constant, and loss factor for these deformations on extracted electromagnetic properties were analyzed using simulated results. Finally, S-parameter measurements were carried out to understand the effect of vertical deformation on permittivity results and to examine any improper sample preparation by hand-made and machine-made samples by applying a statistical model based on mean, standard deviation, coefficient of variation, and confidence interval. It was noted that extracted dielectric constants of each tested dielectric sample (polyethylene, polypropylene, polyvinyl-chloride) were within the confidence interval range of 90% while their retrieved loss factors were within the confidence interval range of 90%, 95%, or 98%.en_US
dc.identifier.doi10.1016/j.measurement.2021.109175
dc.identifier.issn0263-2241
dc.identifier.issn1873-412X
dc.identifier.scopus2-s2.0-85101424585en_US
dc.identifier.scopusqualityQ1en_US
dc.identifier.urihttps://doi.org/10.1016/j.measurement.2021.109175
dc.identifier.urihttp://hdl.handle.net/20.500.12403/3226
dc.identifier.volume176en_US
dc.identifier.wosWOS:000641452500002en_US
dc.identifier.wosqualityQ1en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherElsevier Sci Ltden_US
dc.relation.ispartofMeasurementen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectSampleen_US
dc.subjectDeformationen_US
dc.subjectDielectricen_US
dc.subjectWaveguideen_US
dc.titleEffect of sample deformation in longitudinal axis on material parameter extraction by waveguidesen_US
dc.typeArticleen_US

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