Permittivity Extraction of Electrically Thin Samples by Reflection-Only Free-Space Measurements
Küçük Resim Yok
Tarih
2026
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
Ieee-Inst Electrical Electronics Engineers Inc
Erişim Hakkı
info:eu-repo/semantics/openAccess
Özet
A permittivity extraction procedure is devised for electrically thin samples from reflection-only free-space measurements. Unlike previous studies, this procedure relies on sample-back metal termination measurements especially useful for thinner samples. An objective function independent of antenna transmission characteristics and reference plane position is derived. Minimum and maximum thickness and permittivity values for which our method is applicable are also examined. Free-space measurements at X-band (8.2-12.4 GHz) of a Rogers 4350B sample (approximate to 1.52 mm) and a FR4 sample (approximate to 1.60 mm) were performed to validate our method with a dielectric constant less than 5% variation.
Açıklama
Anahtar Kelimeler
Antenna Characteristics, Free-Space, Frequency-Domain, Metal-Back, Permittivity, Reflection, Thin Sample, Antenna Characteristics, Free-Space, Frequency-Domain, Metal-Back, Permittivity, Reflection, Thin Sample
Kaynak
Ieee Microwave and Wireless Technology Letters
WoS Q Değeri
Q2
Scopus Q Değeri
Q1
Cilt
36
Sayı
7
