Permittivity Extraction of Electrically Thin Samples by Reflection-Only Free-Space Measurements

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dc.contributor.authorHasar, Ugur C.
dc.contributor.authorXue, Bing
dc.contributor.authorOzturk, Hamdullah
dc.contributor.authorKaya, Yunus
dc.contributor.authorOzturk, Gokhan
dc.date.accessioned2026-09-01T15:52:36Z
dc.date.available2026-09-01T15:52:36Z
dc.date.issued2026
dc.departmentBayburt Üniversitesi
dc.description.abstractA permittivity extraction procedure is devised for electrically thin samples from reflection-only free-space measurements. Unlike previous studies, this procedure relies on sample-back metal termination measurements especially useful for thinner samples. An objective function independent of antenna transmission characteristics and reference plane position is derived. Minimum and maximum thickness and permittivity values for which our method is applicable are also examined. Free-space measurements at X-band (8.2-12.4 GHz) of a Rogers 4350B sample (approximate to 1.52 mm) and a FR4 sample (approximate to 1.60 mm) were performed to validate our method with a dielectric constant less than 5% variation.
dc.identifier.doi10.1109/LMWT.2026.3664890
dc.identifier.endpage1195
dc.identifier.issn2771-957X
dc.identifier.issn2771-9588
dc.identifier.issue7
dc.identifier.orcid0000-0002-6098-7762
dc.identifier.scopus2-s2.0-105031958919
dc.identifier.scopusqualityQ1
dc.identifier.startpage1192
dc.identifier.urihttp://dx.doi.org/10.1109/LMWT.2026.3664890
dc.identifier.urihttps://hdl.handle.net/20.500.12403/8496
dc.identifier.volume36
dc.identifier.wosWOS:001708233500001
dc.identifier.wosqualityQ2
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherIeee-Inst Electrical Electronics Engineers Inc
dc.relation.ispartofIeee Microwave and Wireless Technology Letters
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/openAccess
dc.snmzKA_WOS_20260820
dc.subjectAntenna Characteristics
dc.subjectFree-Space
dc.subjectFrequency-Domain
dc.subjectMetal-Back
dc.subjectPermittivity
dc.subjectReflection
dc.subjectThin Sample
dc.subjectAntenna Characteristics
dc.subjectFree-Space
dc.subjectFrequency-Domain
dc.subjectMetal-Back
dc.subjectPermittivity
dc.subjectReflection
dc.subjectThin Sample
dc.titlePermittivity Extraction of Electrically Thin Samples by Reflection-Only Free-Space Measurements
dc.typeArticle

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