Attractive method for thickness-independent permittivity measurements of solid dielectric materials
Küçük Resim Yok
Tarih
2014
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
Erişim Hakkı
info:eu-repo/semantics/closedAccess
Özet
We propose a non-resonant-type method for reference-plane invariant and thickness-independent permittivity measurement of solid dielectric materials when there is no information from permittivity. To achieve this, we derive a branch-index-independent function and verify that it determines the sample thickness and permittivity without resorting to finding the correct branch index value for three different measurement scenarios: (a) measurements at closely separated frequencies of non-dispersive samples, (b) measurements at largely separated frequencies of non-dispersive samples, and (c) measurements at largely separated frequencies of dispersive samples. Via a differential uncertainty analysis, the effect of inaccurate sample thickness on permittivity determination is also presented for demonstration of the improvement achieved by our method. For validation, we measured the permittivity of an approximately 20 mm PTFE sample using the presented method and compared its result with those from other similar methods. From the comparison, we note that the accuracy of tested methods from literature drastically decreases when accurate information of sample thickness is not known (in addition to a further decrease in accuracy when correct transformation factors from reference-planes are not known a priori), while the accuracy of our method is not influenced. © 2013 Elsevier B.V.
Açıklama
Anahtar Kelimeler
Branch-index value, Permittivity measurement, Reference-plane invariant, Solid materials, Thickness-independent, Branch index, Branch-index value, Reference-plane invariant, Sample thickness, Solid material, Thickness-independent, Permittivity, Permittivity measurement, Separation, Uncertainty analysis, Dielectric materials, Branch-index value, Permittivity measurement, Reference-plane invariant, Solid materials, Thickness-independent, Branch index, Branch-index value, Reference-plane invariant, Sample thickness, Solid material, Thickness-independent, Permittivity, Permittivity measurement, Separation, Uncertainty analysis, Dielectric materials
Kaynak
Sensors and Actuators, A: Physical
WoS Q Değeri
Q1
Scopus Q Değeri
Q1
Cilt
206