Attractive method for thickness-independent permittivity measurements of solid dielectric materials

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dc.authorid55885911000
dc.authorid7103318266
dc.authorid55900943000
dc.authorid57198066553
dc.authorid55982628000
dc.authorid56186565500
dc.contributor.authorHasar U.C.
dc.contributor.authorBarroso J.J.
dc.contributor.authorBute M.
dc.contributor.authorKaya Y.
dc.contributor.authorKocadagistan M.E.
dc.contributor.authorErtugrul M.
dc.date.accessioned20.04.201910:49:12
dc.date.accessioned2019-04-20T21:44:11Z
dc.date.available20.04.201910:49:12
dc.date.available2019-04-20T21:44:11Z
dc.date.issued2014
dc.departmentBayburt Üniversitesien_US
dc.description.abstractWe propose a non-resonant-type method for reference-plane invariant and thickness-independent permittivity measurement of solid dielectric materials when there is no information from permittivity. To achieve this, we derive a branch-index-independent function and verify that it determines the sample thickness and permittivity without resorting to finding the correct branch index value for three different measurement scenarios: (a) measurements at closely separated frequencies of non-dispersive samples, (b) measurements at largely separated frequencies of non-dispersive samples, and (c) measurements at largely separated frequencies of dispersive samples. Via a differential uncertainty analysis, the effect of inaccurate sample thickness on permittivity determination is also presented for demonstration of the improvement achieved by our method. For validation, we measured the permittivity of an approximately 20 mm PTFE sample using the presented method and compared its result with those from other similar methods. From the comparison, we note that the accuracy of tested methods from literature drastically decreases when accurate information of sample thickness is not known (in addition to a further decrease in accuracy when correct transformation factors from reference-planes are not known a priori), while the accuracy of our method is not influenced. © 2013 Elsevier B.V.en_US
dc.identifier.doi10.1016/j.sna.2013.11.032
dc.identifier.endpage120
dc.identifier.issn0924-4247
dc.identifier.scopus2-s2.0-84891523141en_US
dc.identifier.scopusqualityQ1en_US
dc.identifier.startpage107
dc.identifier.urihttps://dx.doi.org/10.1016/j.sna.2013.11.032
dc.identifier.urihttps://hdl.handle.net/20.500.12403/791
dc.identifier.volume206
dc.identifier.wosWOS:000331505600015en_US
dc.identifier.wosqualityQ1en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.relation.ispartofSensors and Actuators, A: Physicalen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectBranch-index value
dc.subjectPermittivity measurement
dc.subjectReference-plane invariant
dc.subjectSolid materials
dc.subjectThickness-independent
dc.subjectBranch index
dc.subjectBranch-index value
dc.subjectReference-plane invariant
dc.subjectSample thickness
dc.subjectSolid material
dc.subjectThickness-independent
dc.subjectPermittivity
dc.subjectPermittivity measurement
dc.subjectSeparation
dc.subjectUncertainty analysis
dc.subjectDielectric materials
dc.subjectBranch-index value
dc.subjectPermittivity measurement
dc.subjectReference-plane invariant
dc.subjectSolid materials
dc.subjectThickness-independent
dc.subjectBranch index
dc.subjectBranch-index value
dc.subjectReference-plane invariant
dc.subjectSample thickness
dc.subjectSolid material
dc.subjectThickness-independent
dc.subjectPermittivity
dc.subjectPermittivity measurement
dc.subjectSeparation
dc.subjectUncertainty analysis
dc.subjectDielectric materials
dc.titleAttractive method for thickness-independent permittivity measurements of solid dielectric materialsen_US
dc.typeArticleen_US

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