Determination of Reference-Plane Invariant, Thickness-Independent, and Broadband Constitutive Parameters of Thin Materials
Küçük Resim Yok
Tarih
2015
Yazarlar
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
Institute of Electrical and Electronics Engineers Inc.
Erişim Hakkı
info:eu-repo/semantics/closedAccess
Özet
We propose an effective microwave method for reference-plane-invariant and thickness-independent constitutive parameters measurement of thin materials. A function depending only on the interface reflection coefficient to facilitate fast computations of constitutive parameters is derived. In addition to the extraction of sample thickness, the method can also be applied to unique retrieval of constitutive parameters whose electromagnetic properties are yet unknown. We have performed an uncertainty analysis to examine how the accuracy of the method can be improved. Finally, we have compared the proposed method with other similar methods in the literature using measurements of distilled water and a thinner Plexiglas sample (1 mm). From the comparison, we note that the accuracy of our proposed method is not affected by any inaccurate knowledge of reference-plane positions and the sample length (or both) while those of compared methods are seriously decreased. © 2015 IEEE.
Açıklama
Anahtar Kelimeler
Constitutive parameters, reference-plane invariant, thickness independent, thin samples, Uncertainty analysis, Constitutive parameters, Distilled water, Electromagnetic properties, Fast computation, Microwave methods, Reference plane, Sample thickness, thickness independent, Parameter estimation, Constitutive parameters, reference-plane invariant, thickness independent, thin samples, Uncertainty analysis, Constitutive parameters, Distilled water, Electromagnetic properties, Fast computation, Microwave methods, Reference plane, Sample thickness, thickness independent, Parameter estimation
Kaynak
IEEE Transactions on Microwave Theory and Techniques
WoS Q Değeri
Q1
Scopus Q Değeri
Q1
Cilt
63
Sayı
7
