Determination of Reference-Plane Invariant, Thickness-Independent, and Broadband Constitutive Parameters of Thin Materials

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dc.authorid55885911000
dc.authorid57198066553
dc.authorid7103318266
dc.authorid56186565500
dc.contributor.authorHasar U.C.
dc.contributor.authorKaya Y.
dc.contributor.authorBarroso J.J.
dc.contributor.authorErtugrul M.
dc.date.accessioned20.04.201910:49:12
dc.date.accessioned2019-04-20T21:43:49Z
dc.date.available20.04.201910:49:12
dc.date.available2019-04-20T21:43:49Z
dc.date.issued2015
dc.departmentBayburt Üniversitesien_US
dc.description.abstractWe propose an effective microwave method for reference-plane-invariant and thickness-independent constitutive parameters measurement of thin materials. A function depending only on the interface reflection coefficient to facilitate fast computations of constitutive parameters is derived. In addition to the extraction of sample thickness, the method can also be applied to unique retrieval of constitutive parameters whose electromagnetic properties are yet unknown. We have performed an uncertainty analysis to examine how the accuracy of the method can be improved. Finally, we have compared the proposed method with other similar methods in the literature using measurements of distilled water and a thinner Plexiglas sample (1 mm). From the comparison, we note that the accuracy of our proposed method is not affected by any inaccurate knowledge of reference-plane positions and the sample length (or both) while those of compared methods are seriously decreased. © 2015 IEEE.en_US
dc.identifier.doi10.1109/TMTT.2015.2431685
dc.identifier.endpage2321
dc.identifier.issn0018-9480
dc.identifier.issue7
dc.identifier.scopus2-s2.0-85027945312en_US
dc.identifier.scopusqualityQ1en_US
dc.identifier.startpage2313
dc.identifier.urihttps://dx.doi.org/10.1109/TMTT.2015.2431685
dc.identifier.urihttps://hdl.handle.net/20.500.12403/690
dc.identifier.volume63
dc.identifier.wosWOS:000357622300023en_US
dc.identifier.wosqualityQ1en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.
dc.relation.ispartofIEEE Transactions on Microwave Theory and Techniquesen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectConstitutive parameters
dc.subjectreference-plane invariant
dc.subjectthickness independent
dc.subjectthin samples
dc.subjectUncertainty analysis
dc.subjectConstitutive parameters
dc.subjectDistilled water
dc.subjectElectromagnetic properties
dc.subjectFast computation
dc.subjectMicrowave methods
dc.subjectReference plane
dc.subjectSample thickness
dc.subjectthickness independent
dc.subjectParameter estimation
dc.subjectConstitutive parameters
dc.subjectreference-plane invariant
dc.subjectthickness independent
dc.subjectthin samples
dc.subjectUncertainty analysis
dc.subjectConstitutive parameters
dc.subjectDistilled water
dc.subjectElectromagnetic properties
dc.subjectFast computation
dc.subjectMicrowave methods
dc.subjectReference plane
dc.subjectSample thickness
dc.subjectthickness independent
dc.subjectParameter estimation
dc.titleDetermination of Reference-Plane Invariant, Thickness-Independent, and Broadband Constitutive Parameters of Thin Materialsen_US
dc.typeArticleen_US

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