Two-step numerical procedure for complex permittivity retrieval of dielectric materials from reflection measurements
Küçük Resim Yok
Tarih
2014
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
Springer Verlag
Erişim Hakkı
info:eu-repo/semantics/closedAccess
Özet
A two-step measurement procedure has been proposed for measurement of complex permittivity of dielectric materials using one-port reflection measurements. In the procedure, as a first step, a graphical method is applied to analyze on the complex reflection-coefficient plane the general pattern of dielectric behavior of the sample. Then, as a second step, optimization algorithms are utilized for retrieving electrical properties of samples. The procedure requires measurement of complex reflection scattering parameters of at least two samples with different lengths. It has been validated by X-band measurements of three polyvinyl chloride samples with lengths 5, 10, and 20 mm. © 2014 Springer-Verlag Berlin Heidelberg.
Açıklama
Anahtar Kelimeler
Algorithms, Optimization, Scattering parameters, Complex permittivity, Complex reflection, Dielectric behavior, Measurement of complex permittivity, Measurement procedures, Numerical procedures, Optimization algorithms, Reflection measurements, Dielectric materials, Algorithms, Optimization, Scattering parameters, Complex permittivity, Complex reflection, Dielectric behavior, Measurement of complex permittivity, Measurement procedures, Numerical procedures, Optimization algorithms, Reflection measurements, Dielectric materials
Kaynak
Applied Physics A: Materials Science and Processing
WoS Q Değeri
Q2
Scopus Q Değeri
Q2
Cilt
116
Sayı
4
