Two-step numerical procedure for complex permittivity retrieval of dielectric materials from reflection measurements

Küçük Resim Yok

Tarih

2014

Dergi Başlığı

Dergi ISSN

Cilt Başlığı

Yayıncı

Springer Verlag

Erişim Hakkı

info:eu-repo/semantics/closedAccess

Özet

A two-step measurement procedure has been proposed for measurement of complex permittivity of dielectric materials using one-port reflection measurements. In the procedure, as a first step, a graphical method is applied to analyze on the complex reflection-coefficient plane the general pattern of dielectric behavior of the sample. Then, as a second step, optimization algorithms are utilized for retrieving electrical properties of samples. The procedure requires measurement of complex reflection scattering parameters of at least two samples with different lengths. It has been validated by X-band measurements of three polyvinyl chloride samples with lengths 5, 10, and 20 mm. © 2014 Springer-Verlag Berlin Heidelberg.

Açıklama

Anahtar Kelimeler

Algorithms, Optimization, Scattering parameters, Complex permittivity, Complex reflection, Dielectric behavior, Measurement of complex permittivity, Measurement procedures, Numerical procedures, Optimization algorithms, Reflection measurements, Dielectric materials, Algorithms, Optimization, Scattering parameters, Complex permittivity, Complex reflection, Dielectric behavior, Measurement of complex permittivity, Measurement procedures, Numerical procedures, Optimization algorithms, Reflection measurements, Dielectric materials

Kaynak

Applied Physics A: Materials Science and Processing

WoS Q Değeri

Q2

Scopus Q Değeri

Q2

Cilt

116

Sayı

4

Künye