Two-step numerical procedure for complex permittivity retrieval of dielectric materials from reflection measurements

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dc.authorid55885911000
dc.authorid7103318266
dc.authorid57198066553
dc.authorid56186565500
dc.authorid55900943000
dc.authorid35447776300
dc.contributor.authorHasar U.C.
dc.contributor.authorBarroso J.J.
dc.contributor.authorKaya Y.
dc.contributor.authorErtugrul M.
dc.contributor.authorBute M.
dc.contributor.authorCatalá-Civera J.M.
dc.date.accessioned20.04.201910:49:12
dc.date.accessioned2019-04-20T21:44:19Z
dc.date.available20.04.201910:49:12
dc.date.available2019-04-20T21:44:19Z
dc.date.issued2014
dc.departmentBayburt Üniversitesien_US
dc.description.abstractA two-step measurement procedure has been proposed for measurement of complex permittivity of dielectric materials using one-port reflection measurements. In the procedure, as a first step, a graphical method is applied to analyze on the complex reflection-coefficient plane the general pattern of dielectric behavior of the sample. Then, as a second step, optimization algorithms are utilized for retrieving electrical properties of samples. The procedure requires measurement of complex reflection scattering parameters of at least two samples with different lengths. It has been validated by X-band measurements of three polyvinyl chloride samples with lengths 5, 10, and 20 mm. © 2014 Springer-Verlag Berlin Heidelberg.en_US
dc.identifier.doi10.1007/s00339-014-8303-9
dc.identifier.endpage1710
dc.identifier.issn0947-8396
dc.identifier.issue4
dc.identifier.scopus2-s2.0-84906316974en_US
dc.identifier.scopusqualityQ2en_US
dc.identifier.startpage1701
dc.identifier.urihttps://dx.doi.org/10.1007/s00339-014-8303-9
dc.identifier.urihttps://hdl.handle.net/20.500.12403/829
dc.identifier.volume116
dc.identifier.wosWOS:000340583000022en_US
dc.identifier.wosqualityQ2en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherSpringer Verlag
dc.relation.ispartofApplied Physics A: Materials Science and Processingen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectAlgorithms
dc.subjectOptimization
dc.subjectScattering parameters
dc.subjectComplex permittivity
dc.subjectComplex reflection
dc.subjectDielectric behavior
dc.subjectMeasurement of complex permittivity
dc.subjectMeasurement procedures
dc.subjectNumerical procedures
dc.subjectOptimization algorithms
dc.subjectReflection measurements
dc.subjectDielectric materials
dc.subjectAlgorithms
dc.subjectOptimization
dc.subjectScattering parameters
dc.subjectComplex permittivity
dc.subjectComplex reflection
dc.subjectDielectric behavior
dc.subjectMeasurement of complex permittivity
dc.subjectMeasurement procedures
dc.subjectNumerical procedures
dc.subjectOptimization algorithms
dc.subjectReflection measurements
dc.subjectDielectric materials
dc.titleTwo-step numerical procedure for complex permittivity retrieval of dielectric materials from reflection measurementsen_US
dc.typeArticleen_US

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